An extensive range of probe cards are available to suit many probing applications and test equipment. Semiconductor 4 1/2″ probe cards can be mounted with any of the assortment of probe styles to suit the particular device under test and application. Epoxy ring style cards are also available in this size. The hybrid industry typically uses 6 1/2″ probe cards commensurate with larger substrate and device sizes. Chip resistor probe cards suitable for laser trimming of arrays of chip resistor provide extremely high efficiency. Round probe cards can also use the full compliment of probe styles and are typically mounted to a load board. Low current and other device and substrate measurements use specialized parametric test probe cards.