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Accuprobe Parametric Test Probe Cards
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Accuprobe Metal Blade Probes
Metal Blade Probe

Parametric Test Probe Cards

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Category: Probe Card Tag: Hybrid
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  • Description
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Description

Accuprobe can now manufacture and offer to Keithley customers probe card assemblies for the S400, 600 and 900 Parametric Test Systems. A full range of probe cards including Ceramic Blade, Epoxy-Ring, and Coax- Epoxy can be supplied. Customers are assured that critical parametric measurements necessary for superior wafer test yield are obtainable with the Keithley and Accuprobe combination.

Download (information): Keithley Probe Card

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