Parametric Test Probe Cards
Accuprobe can now manufacture and offer to Keithley customers probe card assemblies for the S400, 600 and 900 Parametric Test Systems. A full range of probe cards including Ceramic Blade, Epoxy-Ring, and Coax- Epoxy can be supplied. Customers are assured that critical parametric measurements necessary for superior wafer test yield are obtainable with the Keithley and Accuprobe combination.
Download (information): Keithley Probe Card