Accuprobe provides a full range of probes used to test active and passive semiconductor and hybrid devices. Adjustable probes provide the ultimate in flexibility and maintainability. Metal blades probes are the workhorse of the industry and are available in a wide range of types and sizes. Ceramic blade probes have particular application in sensitive and high-frequency measurement applications. Pogo probes are useful where uneven substrates need to be accessed and tested. A full page view of the probes profiles is available here. For additional information on these product types please click the links below.

Blade spring (pogo) probes
Ceramic blade probes
Metal blade probes
Probe card edge sensors
Z-adjustable probes